Produkt mají v nabídce:
Reliability Wearout Mechanisms in Advanced CMOS Technologies - Strong, Alvin W. (IBM) a Wu, Ernest Y. (IBM) a Vollertsen, Rolf-Peter (Infineon) a Sune, Jordi (Universitat Autonoma de Barcelona, Spain) a La Rosa, Giuseppe (IBM) a Sullivan, Timothy D. (IBM) a Rauch, Stewart E.
This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
