Detail produktu

Produkt mají v nabídce:

Bookshop
5 075 Kč
Do eshopu

Spectroscopic Ellipsometry - Fujiwara, Hiroyuki (National Institute of Advanced Industrial Science a Technology, Tsukuba, Japan)

Ellipsometry is a powerful tool used for the characterization of thin films and multi-layer semiconductor structures. This book deals with fundamental principles and applications of spectroscopic ellipsometry (SE).

Podobné produkty

↑