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Reflection High-Energy Electron Diffraction - Ichimiya, Ayahiko (Nagoya University, Japan) a Cohen, Philip I. (University of Minnesota)

Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts.

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Detail produktu

Produkt mají v nabídce:

Reflection High-Energy Electron Diffraction - Ichimiya, Ayahiko (Nagoya University, Japan) a Cohen, Philip I. (University of Minnesota)

Podobné produkty

Reflection High-Energy Electron Diffraction - Ichimiya, Ayahiko (Nagoya University, Japan) a Cohen, Philip I. (University of Minnesota)

High Energy Electron Diffraction and Microscopy - Peng, L.M. (Dept of Electronics, Peking University, Beijing) a Dudarev, S.L. (EURATOM/UKAEA Fusion Association, Culham Science Centre, Oxfordshire) a Whelan, M.J. (Dept of Materials, University of Oxford)

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