Produkt mají v nabídce:
Integrated Circuit Quality and Reliability - Hnatek, Eugene R. (Encinitas, California, USA)
Examines various aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This work discusses: circuit design technology trends; sources of error in wafer fabrication and assembly; avenues of contamination; IC packaging methods; and, in-line process monitors and test structures.
