Produkt mají v nabídce:
Swift Ion Beam Analysis in Nanosciences - Jalabert, Denis (CEA, France) a Vickridge, Ian (CNRS, France) a Chabli, Amal (CEA, France)
Produkt Swift Ion Beam Analysis in Nanosciences - Jalabert, Denis (CEA, France) a Vickridge, Ian (CNRS, France) a Chabli, Amal (CEA, France) zakoupíte na Bookshop.cz od nakladatele ISTE Ltd and John Wiley & Sons Inc.
