Produkt mají v nabídce:
Nanometer-scale Defect Detection Using Polarized Light - Dahoo, Pierre-Richard (University of Versailles Saint-Quentin, France) a Pougnet, Philippe (Vedecom Institute, Versailles, France) a El Hami, Abdelkhalak (Institut National des Sciences Appliquees (INSA-Rouen), France)
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
