Produkt mají v nabídce:
Digital Holography for MEMS and Microsystem Metrology - Asundi, Anand (Nanyang Technological University, Singapore)
By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.
